References

The public standards, reports and primary documents this topic draws on. Every factual claim in the preceding chapters traces to one of these; the numeric examples (the weighted-coverage table, the ambiguity arithmetic, the rollup) are illustrative and belong to no source.

Standards and handbooks

1. MIL-STD-2165, Testability Program for Electronic Systems and Equipments, US Department of Defense (Naval Electronic Systems Command), 26 January 1985 (the founding programme standard: the definition of testability, and the task structure spanning testability requirements, allocation, prediction/analysis, and demonstration).
2. MIL-STD-2165A, Testability Program for Systems and Equipments, US Department of Defense, 1 February 1993; cancelled July 1995 (the revised task structure: diagnostic concepts and requirements, inherent testability design and assessment, test design and assessment).
3. MIL-HDBK-2165, Testability Handbook for Systems and Equipment, US Department of Defense, 31 July 1995 (the guidance redesignation of MIL-STD-2165A; the ambiguity-group sizing and no-defect-found design guidance).
4. IEC 60706-5:2007, Maintainability of equipment, Part 5: Testability and diagnostic testing, Edition 2.0, International Electrotechnical Commission, 2007 (testability considered early in design; diagnostic test procedures for operation and maintenance).
5. MIL-STD-1309D, Definitions of Terms for Testing, Measurement, and Diagnostics, US Department of Defense, 12 February 1992 (the vocabulary behind built-in test, fault detection and isolation, and false alarms).
6. IEEE Std 1149.1, IEEE Standard for Test Access Port and Boundary-Scan Architecture, IEEE; first edition 1990, latest revision IEEE Std 1149.1-2013 (the boundary-scan architecture known as JTAG).
7. IEEE Std 1522-2004, IEEE Standard for Testability and Diagnosability Characteristics and Metrics, IEEE, 2004; issued for trial use and since withdrawn (the formal failure-rate-weighted detection and isolation metrics, including the expected percentage of faults detected).
8. MIL-HDBK-470A, Designing and Developing Maintainable Products and Systems, Volume I, US Department of Defense, 4 August 1997 (dependency modelling as the system-level testability analysis, with the WSTA, STAT and STAMP tool family; diagnosis inside the corrective-maintenance time elements).
9. MIL-HDBK-338B, Electronic Reliability Design Handbook, US Department of Defense, 1 October 1998 (fault localization and isolation among the corrective-maintenance steps; the maintainability arithmetic that consumes isolation resolution).

Industry reports

10. ARINC Report 604-1, Guidance for Design and Use of Built-In Test Equipment (BITE), Aeronautical Radio, Inc. (Airlines Electronic Engineering Committee), 1 October 1988 (the avionics BITE and centralized fault display guidance).
11. ARINC Report 672, Guidelines for the Reduction of No Fault Found (NFF), ARINC Industry Activities (SAE ITC), 1 June 2008 (the structured NFF identification and root-cause process; the design connection to component and system testability).

For the repair-time arithmetic that consumes isolation resolution, see the Maintainability references; for the latent-unavailability ledger the undetected fraction feeds, see the Availability references.