The public standards and primary documents this topic draws on. Every factual claim in the preceding chapters traces to one of these; the worked example's ratings, ceilings and temperatures are illustrative teaching values in the shape the standards use, and belong to no source.
Derating standards
- ECSS-Q-ST-30-11C Rev.2, Space product assurance: Derating, EEE components, European Cooperation for Space Standardization, 2021 (the European space derating requirements, by component family).
- NASA EEE-INST-002, Instructions for EEE Parts Selection, Screening, Qualification, and Derating, NASA Goddard Space Flight Center, April 2008, with Addendum 1 (derating tables alongside the part quality levels 1, 2 and 3 that set them).
- NAVSEA TE000-AB-GTP-010 Rev.1, Parts Derating Requirements and Application Manual for Navy Electronic Equipment, Naval Sea Systems Command (the Navy derating manual, by part family and application).
- MIL-HDBK-1547A, Electronic Parts, Materials, and Processes for Space and Launch Vehicles, US Department of Defense (the military space lineage; its derating requirements accompany the parts, materials and processes controls).
- MIL-STD-975M, NASA Standard Electrical, Electronic, and Electromechanical (EEE) Parts List, Notice M, 5 August 1994 (the standard parts list whose derating appendix remains in use on legacy programmes; superseded for Goddard work by EEE-INST-002 at entry 2).
Supporting standards and handbooks
- MIL-HDBK-217F Notice 2, Reliability Prediction of Electronic Equipment, US Department of Defense, 28 February 1995 (the temperature and stress factors that price a derating decision; the
πV = (S/0.6)⁵ + 1form and the ArrheniusπT). - MIL-HDBK-338B, Electronic Reliability Design Handbook, US Department of Defense, 1 October 1998 (derating within the reliability design programme, and its relationship to part selection and thermal design).
- MIL-STD-1629A, Procedures for Performing a Failure Mode, Effects and Criticality Analysis, US Department of Defense, 24 November 1980 (where a waived overstress is recorded as a failure mode).
For the failure-rate models the two factors belong to, see the Reliability Prediction references; for the worksheet a waived violation is recorded in, the FMECA references.